2024-03-28T23:27:27Z
https://niigata-u.repo.nii.ac.jp/oai
oai:niigata-u.repo.nii.ac.jp:00003680
2022-12-15T03:36:46Z
423:424:425
453:454
Measurement of Residual Stress Distribution by Strain Scanning Method using High Energy X-rays from Synchrotron Source
高エネルギー放射光を用いたひずみスキャニング法による残留応力分布測定
高エネルギー放射光を用いたひずみスキャニング法による残留応力分布測定
町屋, 修太郎
44612
秋庭, 義明
44613
鈴木, 賢治
44614
田中, 啓介
44615
栗村, 隆之
44616
小熊, 英隆
44617
Thermal Barrier Coating
X-ray Stress Measurement
Residual Stress
Strain Scanning
Ceramics
Synchrotron
A residual stress distribution in thermal barrier coatings can be measured using the strain scanning method with high energy X-rays from a synchrotoron source due to its large penetration depth. For the double slits optics, the peak aberration of the measured diffraction becomes large, when the gage volume crosses the surface. The analytical correction method for the peak aberration was proposed in this paper. The surface aberration effect was corrected by taking account of the difference between the center of the goniometer and the optical centroid of the gage volume. Using the correction method, the distribution of the residual stress in thermal barrier coatings were measured from the surface to about 0.26mm inside. For the as-sprayed top coating, the in-plane residual stress was approximately 30 MPa, and out-of-plane stress increased near by interface. For the coating subjected to the heat cycle (1 773K), the both residual stress were relesed.
journal article
日本機械学会
2005-11
application/pdf
日本機械学会論文集. A編
711
71
1530
1537
日本機械学会論文集. A編
AN0018742X
03875008
https://niigata-u.repo.nii.ac.jp/record/3680/files/9_0014.pdf
jpn
http://ci.nii.ac.jp/naid/110004999114
日本機械学会 / 本文データは学会の許諾に基づくCiNiiからの複製である