2024-03-29T14:45:38Z
https://niigata-u.repo.nii.ac.jp/oai
oai:niigata-u.repo.nii.ac.jp:00031036
2022-12-15T03:59:30Z
423:435:1827
453:457
Phase-shifting laser diode Sagnac interferometer for surface profile measurement
Phase-shifting laser diode Sagnac interferometer for surface profile measurement
Suzuki, Takamasa
Shirai, Masato
Sasaki, Osami
Copyright(C)2007 Society of Photo-Optical Instrumentation Engineers
laser diode
Sagnac interferometer
phase-shift
surface profile measurement
A phase-shifting Sagnac interferometer that uses wavelength tunability of the laser diode is proposed. A Sagnac interferometer itself is robust for the mechanical disturbances because it has a common path configuration and requires no special reference. Unbalanced optical path introduced between p- and s-polarized beams enables us to implement easy phase-shift by the direct current modulation. Several experimental results indicate that the proposed system is useful for the disturbance-free precise measurement.
Advanced materials and devices for sensing and imaging 3 : 12-14 November 2007 : Beijing, China.
International Society for Optical Engineering, SPIE
2007-11
eng
conference paper
http://hdl.handle.net/10191/31155
https://niigata-u.repo.nii.ac.jp/records/31036
info:doi/10.1117/12.756447
AA10619755
0277786X
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of SPIE - the International Society for Optical Engineering
6829
68290A-1
68290A-8
https://niigata-u.repo.nii.ac.jp/record/31036/files/6829_68290A.pdf
application/pdf
4.2 MB
2019-08-26