2024-03-28T10:04:01Z
https://niigata-u.repo.nii.ac.jp/oai
oai:niigata-u.repo.nii.ac.jp:00002144
2022-12-15T03:35:02Z
154:501:502
453:454
X-ray Study of Residual Stress Distribution of Ground Ceramics
Sakaida, Yoshihisa
Tanaka, Keisuke
Ikuhara, Yuichi
Suzuki, Kenji
Ceramics
Residual Stress
Grinding
X-ray Stress Measurement
Dislocation
Glancing Incidence X-ray Diffraction Method
Transmission Electron Microscopy
The residual stress distribution of ground ceramics was determined from the eigen strain distributed near the ground surface. The eigen strain of ground ceramics was tensile, and exponentially decreased with the distance from the surface. The residual stress distribution is given as a superposition of an exponential function of compression and a linear function. It is found that the actual residual stress distribution can be approximated by an exponential function of compression because the magnitude of tensile residual stress is negligibly small compared to the compressive residual stress. In the experiments, the diffraction angle was measured on ground silicon nitride for a wide range of sin^2Ψ using the glancing incidence X-ray diffraction technique. A strong nonlinearity was found in the 2θ-sin^2Ψ diagram at very highΨ-angles. From the analysis of nonlinearity, the residual stress distribution was determined. The residual stress distribution of silicon nitride coincided with the distribution calculated from the eigen strain distribution. Transmission electron microscopy was used to clarify the origin of generation of the residual stress. Both strain contrasts and microcracks were observed below the ground surface ; straight dislocations were also observed within silicon nitride grains near the ground surface.
Japan Society of Mechanical Engineers
1998
eng
journal article
VoR
http://hdl.handle.net/10191/18179
https://niigata-u.repo.nii.ac.jp/records/2144
http://doi.org/10.1299/jsmea.41.422
AA11179396
1344-7912
JSME International Journal. Series A, Solid mechanics and material engineering.
41
3
422
429
https://niigata-u.repo.nii.ac.jp/record/2144/files/41-3_422.pdf
application/pdf
1.9 MB
2019-07-29