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Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control
http://hdl.handle.net/10191/27492
http://hdl.handle.net/10191/2749273490c7d-2436-4131-9062-144c3ecdaf89
名前 / ファイル | ライセンス | アクション |
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4829_853-855.pdf (238.5 kB)
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Item type | 会議発表論文 / Conference Paper(1) | |||||
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公開日 | 2014-06-20 | |||||
タイトル | ||||||
タイトル | Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Generation of a ruler marked out every a wavelength by a sinusoidal wavelength-scanning interferometer with double feedback control | |||||
言語 | ||||||
言語 | eng | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_5794 | |||||
タイプ | conference paper | |||||
著者 |
Sasaki, Osami
× Sasaki, Osami× Akiyama, Hisashi× Suzuki, Takamasa |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Phase modulation amplitude Z_b caused by a sinusoidal wavelength-scanning and conventional phase α of an interference signal are kept at π and 3π/2, respectively, with feedback control systems for a displacement of an object larger than a half-wavelength. A voltage applied to a device that provides the wavelength-scannig becomes a ruler marked out every a wavelength. Real-time distance measurement is carried out with this interferometer. | |||||
内容記述 | ||||||
内容記述タイプ | Other | |||||
内容記述 | 19th congress of the international commission for optics : optics for the quality of life : 25-30 August 2002 : Firenze, Italy. : Aug 2002, Firenze, Italy | |||||
書誌情報 |
Proceedings of SPIE - the International Society for Optical Engineering en : Proceedings of SPIE - the International Society for Optical Engineering 巻 4829, p. 853-855, 発行日 2002-08 |
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出版者 | ||||||
出版者 | International Society for Optical Engineering, SPIE | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 0277786X | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA10619755 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | info:doi/10.1117/12.530947 | |||||
権利 | ||||||
権利情報 | Copyright 2002 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. | |||||
著者版フラグ | ||||||
値 | publisher |