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Exact Error Rate Analysis for Pulsed DS- and Hybrid DS/TH-CDMA in Nakagami Fading
http://hdl.handle.net/10191/22266
http://hdl.handle.net/10191/222660cee4221-6815-45b9-99f1-055d4369f436
名前 / ファイル | ライセンス | アクション |
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91_11_3150-3162.pdf (656.7 kB)
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Item type | 学術雑誌論文 / Journal Article(1) | |||||
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公開日 | 2013-05-16 | |||||
タイトル | ||||||
タイトル | Exact Error Rate Analysis for Pulsed DS- and Hybrid DS/TH-CDMA in Nakagami Fading | |||||
タイトル | ||||||
言語 | en | |||||
タイトル | Exact Error Rate Analysis for Pulsed DS- and Hybrid DS/TH-CDMA in Nakagami Fading | |||||
言語 | ||||||
言語 | eng | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | ultra-wideband | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | code division multiple access | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | error rate analysis | |||||
キーワード | ||||||
主題Scheme | Other | |||||
主題 | Nakagami fading | |||||
資源タイプ | ||||||
資源 | http://purl.org/coar/resource_type/c_6501 | |||||
タイプ | journal article | |||||
著者 |
Rahman, Mohammad Azizur
× Rahman, Mohammad Azizur× Sasaki, Shigenobu× Kikuchi, Hisakazu× Harada, Hiroshi× Kato, Shuzo |
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抄録 | ||||||
内容記述タイプ | Abstract | |||||
内容記述 | Exact bit error probabilities (BEP) are derived in closed-form for binary pulsed direct sequence (DS-) and hybrid direct sequence time hopping code division multiple access (DS/TH-CDMA) systems that have potential applications in ultra-wideband (UWB) communications. Flat Nakagami fading channel is considered and the characteristic function (CF) method is adopted. An exact expression of the CF is obtained through a straightforward method, which is simple and good for any arbitrary pulse shape. The CF is then used to obtain the exact BEP that requires less computational complexity than the method based on improved Gaussian approximation (IGA). It is shown under identical operating conditions that the shape of the CF, as well as, the BEP differs considerably for the two systems. While both the systems perform comparably in heavily faded channel, the hybrid system shows better BEP performance in lightly-faded channel. The CF and BEP also strongly depend on chip length and chip-duty that constitute the processing gain (PG). Different combinations of the parameters may result into the same PG and the BEP of a particular system for a constant PG, though remains nearly constant in a highly faded channel, may vary substantially in lightly-faded channel. A comparison of the results from the exact method with those from the standard Gaussian approximation (SGA) reveals that the SGA, though accurate for both the systems in highly-faded channel, becomes extremely optimistic for low-duty systems in lightly-faded channel. The SGA also fails to track several other system trade-offs. | |||||
書誌情報 |
IEICE transactions on fundamentals of electronics, communications and computer sciences en : IEICE transactions on fundamentals of electronics, communications and computer sciences 巻 E91-A, 号 11, p. 3150-3162, 発行日 2008-11 |
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出版者 | ||||||
出版者 | 電子情報通信学会 | |||||
ISSN | ||||||
収録物識別子タイプ | ISSN | |||||
収録物識別子 | 09168508 | |||||
書誌レコードID | ||||||
収録物識別子タイプ | NCID | |||||
収録物識別子 | AA10826239 | |||||
DOI | ||||||
識別子タイプ | DOI | |||||
関連識別子 | info:doi/10.1093/ietfec/e91-a.11.3150 | |||||
権利 | ||||||
権利情報 | Copyright (C) 2008 IEICE | |||||
著者版フラグ | ||||||
値 | publisher | |||||
異版である | ||||||
関連タイプ | isVersionOf | |||||
識別子タイプ | URI | |||||
関連識別子 | http://www.ieice.org/jpn/trans_online/ |