Fringe analysis methods that employ wavelet transform are described. The performances of the methods are examined from the viewpoints of required calculation time and accuracy. Further, accuracies of calculations performed using linear and logarithmic scales in wavelet transform are compared. Experimental results show that wavelet signal processing is effective in measuring profiles having large and gradual asperities.
内容記述
Optoelectronic measurement technology and applications : 16-19 November 2008 : Beijing, China.
雑誌名
Proceedings of SPIE - the International Society for Optical Engineering
巻
7160
ページ
716002-1 - 716002-12
発行年
2008-11
出版者
International Society for Optical Engineering, SPIE
ISSN
0277786X
書誌レコードID
AA10619755
DOI
info:doi/10.1117/12.817853
権利
Copyright(C)2008 Society of Photo-Optical Instrumentation Engineers